Christopher LeBlanc

Phone: (603) 641-4323
Office: Applied Engineering & Sciences, 88 Commercial Street, RM 107, Manchester, NH 03101
Chris LeBlanc

Christopher D. LeBlanc is currently the Program Coordinator and Assistant Professor for the Engineering Technology program at the University of New Hampshire Manchester campus. Prior to his faculty appointment he spent 16 years at International Business Machines (IBM) as an Analog Mixed Signal design engineer. Professor LeBlanc's areas of expertise are Very Large Scale Integrated (VLSI) circuit design, semiconductor physics, and Analog Mixed signal design. He is an active member and author in the Institute of Electrical and Electronic Engineers (IEEE) and American Society of Engineering Education (ASEE). Professor LeBlanc has published in conference proceedings and journals for both IEEE and ASEE in the areas of Analog Mixed Signal Circuit Design, Memory Architecture, Phased Locked Loops, Voltage Regulator Architecture, Radiation Tolerance for Application Specific Integrated Circuits (ASICs), Engineering Technology education, and accreditation.

Professor LeBlanc holds a Bachelor of Science degree in Electrical Engineering from the University of Massachusetts Amherst and Master of Science in Electrical Engineering degree from the University of Vermont.


  • M.S., University of Vermont
  • B.S., University of Massachusetts - Amherst
  • B.S., University of Massachusetts - Lowell

Courses Taught

  • ET 671: Digital Systems Lab
  • ET 675: Electrical Technology Lab
  • ET 677: Analog Systems Lab
  • ET 680: Communications and Fields Lab
  • ET 697: Top/Electrical Engrnrng Tech
  • ET 788: Intro to DSP
  • ET 790: Microcomputer Technology
  • ET 791: Electrical Engnrg Tech Project

Selected Publications

Bulzacchelli, J. F., Toprak-Deniz, Z., Rasmus, T. M., Iadanza, J. A., Bucossi, W. L., Kim, S., . . . Friedman, D. J. (2012). Dual-Loop System of Distributed Microregulators With High DC Accuracy, Load Response Time Below 500 ps, and 85-mV Dropout Voltage. IEEE Journal of Solid-State Circuits, 47(4), 863-874. doi:10.1109/jssc.2012.2185354

Most Cited Publications